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1

[IEEE 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) - Jeju, Korea (South) (2018.1.22-2018.1.25)] 2018 23rd Asia and South Pacific Design Automation Conference (ASP-DAC) - Multi-level timing simulation on GPUs

Schneider, Eric, Kochte, Michael A., Wunderlich, Hans-Joachim

Year:

2018

Language:

english

File:

PDF, 191 KB

english, 2018

2

BIST for systems-on-a-chip

Hans-Joachim Wunderlich

Journal:

Integration, the VLSI Journal

Year:

1998

Language:

english

File:

PDF, 740 KB

english, 1998

3

Efficient Concurrent Self-Test with Partially Specified Patterns

Michael A. Kochte, Christian G. Zoellin, Hans-Joachim Wunderlich

Journal:

Journal of Electronic Testing

Year:

2010

Language:

english

File:

PDF, 392 KB

english, 2010

4

Application of Deterministic Logic BIST on Industrial Circuits

Gundolf Kiefer, Harald Vranken, Erik Jan Marinissen, Hans-Joachim Wunderlich

Journal:

Journal of Electronic Testing

Year:

2001

Language:

english

File:

PDF, 639 KB

english, 2001

5

[IEEE 2009 14th IEEE European Test Symposium (ETS) - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - Concurrent Self-Test with Partially Specified Patterns for Low Test Latency and Overhead

Kochte, Michael A., Zoellin, Christian G., Wunderlich, Hans-Joachim

Year:

2009

Language:

english

File:

PDF, 239 KB

english, 2009

6

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Built-in self-diagnosis exploiting strong diagnostic windows in mixed-mode test

Cook, Alejandro, Hellebrand, Sybille, Wunderlich, Hans-Joachim

Year:

2012

Language:

english

File:

PDF, 896 KB

english, 2012

7

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Non-intrusive integration of advanced diagnosis features in automotive E/E-architectures

Abelein, Ulrich, Cook, Alejandro, Engelke, Piet, Glas, Michael, Reimann, Felix, Gomez, Laura Rodriguez, Russ, Thomas, Teich, Jurgen, Ull, Dominik, Wunderlich, Hans-Joachim

Year:

2014

Language:

english

File:

PDF, 1.09 MB

english, 2014

8

GPU-Accelerated Simulation of Small Delay Faults

Schneider, Eric, Kochte, Michael A., Holst, Stefan, Wen, Xiaoqing, Wunderlich, Hans-Joachim

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2017

Language:

english

File:

PDF, 5.92 MB

english, 2017

9

Self-Test and Diagnosis for Self-Aware Systems Survey for Design & Test Special Issue on “Self-Awareness in SoCs”

Kochte, Michael A., Wunderlich, Hans-Joachim

Journal:

IEEE Design and Test

Year:

2017

Language:

english

File:

PDF, 1.04 MB

english, 2017

10

Neural mechanisms underlying reaching for remembered targets cued kinesthetically or visually in left or right hemispace

Andrew J. Butler, Gereon R. Fink, Christian Dohle, Gilbert Wunderlich, Lutz Tellmann, Rudiger J. Seitz, Karl Zilles, Hans-Joachim Freund

Journal:

Human Brain Mapping

Year:

2004

Language:

english

File:

PDF, 326 KB

english, 2004

11

An analytical approach to the partial scan problem

Arno Kunzmann, Hans-Joachim Wunderlich

Journal:

Journal of Electronic Testing

Year:

1990

Language:

english

File:

PDF, 885 KB

english, 1990

12

A mixed-mode BIST scheme based on folding compression

Huaguo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich

Journal:

Journal of Computer Science and Technology

Year:

2002

Language:

english

File:

PDF, 888 KB

english, 2002

13

Adaptive Debug and Diagnosis Without Fault Dictionaries

Stefan Holst, Hans-Joachim Wunderlich

Journal:

Journal of Electronic Testing

Year:

2009

Language:

english

File:

PDF, 342 KB

english, 2009

14

Visualization of Somatostatin Receptors in Prostate Cancer and its Bone Metastases with Ga-68–DOTATOC PET/CT

Wolfgang Luboldt, Klaus Zöphel, Gerd Wunderlich, Andrij Abramyuk, Hans-Joachim Luboldt, Joerg Kotzerke

Journal:

Molecular Imaging and Biology

Year:

2010

Language:

english

File:

PDF, 271 KB

english, 2010

15

Variation-aware fault modeling

Fabian Hopsch, Bernd Becker, Sybille Hellebrand, Ilia Polian, Bernd Straube, Wolfgang Vermeiren, Hans-Joachim Wunderlich

Journal:

SCIENCE CHINA Information Sciences

Year:

2011

Language:

english

File:

PDF, 755 KB

english, 2011

16

Efficient multi-level fault simulation of HW/SW systems for structural faults

Rafal Baranowski, Stefano Di Carlo, Nadereh Hatami, Michael E. Imhof, Michael A. Kochte, Paolo Prinetto, Hans-Joachim Wunderlich, Christian G. Zoellin

Journal:

SCIENCE CHINA Information Sciences

Year:

2011

Language:

english

File:

PDF, 359 KB

english, 2011

17

Mixed-Mode BIST Using Embedded Processors

Sybille Hellebrand, Hans-Joachim Wunderlich, Andre Hertwig

Journal:

Journal of Electronic Testing

Year:

1998

Language:

english

File:

PDF, 475 KB

english, 1998

18

Deterministic BIST with Multiple Scan Chains

Gundolf Kiefer, Hans-Joachim Wunderlich

Journal:

Journal of Electronic Testing

Year:

1999

Language:

english

File:

PDF, 274 KB

english, 1999

19

Deterministic BIST with Partial Scan

Gundolf Kiefer, Hans-Joachim Wunderlich

Journal:

Journal of Electronic Testing

Year:

2000

Language:

english

File:

PDF, 79 KB

english, 2000

20

Minimized Power Consumption for Scan-Based BIST

Stefan Gerstendörfer, Hans-Joachim Wunderlich

Journal:

Journal of Electronic Testing

Year:

2000

Language:

english

File:

PDF, 76 KB

english, 2000

21

A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters

Sybille Hellebrand, Hua-Guo Liang, Hans-Joachim Wunderlich

Journal:

Journal of Electronic Testing

Year:

2001

Language:

english

File:

PDF, 184 KB

english, 2001

22

Reusing Scan Chains for Test Pattern Decompression

Rainer Dorsch, Hans-Joachim Wunderlich

Journal:

Journal of Electronic Testing

Year:

2002

Language:

english

File:

PDF, 646 KB

english, 2002

23

Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST

Hua-Guo Liang, Sybille Hellebrand, Hans-Joachim Wunderlich

Journal:

Journal of Electronic Testing

Year:

2002

Language:

english

File:

PDF, 438 KB

english, 2002

24

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Structural Test for Graceful Degradation of NoC Switches

Dalirsani, Atefe, Holst, Stefan, Elm, Melanie, Wunderlich, Hans-Joachim

Year:

2011

Language:

english

File:

PDF, 280 KB

english, 2011

25

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Efficient Simulation of Structural Faults for the Reliability Evaluation at System-Level

Kochte, Michael A., Zoellin, Christian G., Baranowski, Rafal, Imhof, Michael E., Wunderlich, Hans-Joachim, Hatami, Nadereh, Carlo, Stefano Di, Prinetto, Paolo

Year:

2010

Language:

english

File:

PDF, 307 KB

english, 2010

26

[IEEE 2010 28th VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2010.04.19-2010.04.22)] 2010 28th VLSI Test Symposium (VTS) - Low-power test planning for arbitrary at-speed delay-test clock schemes

Zoellin, Christian G., Wunderlich, Hans-Joachim

Year:

2010

Language:

english

File:

PDF, 510 KB

english, 2010

27

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Towards Variation-Aware Test Methods

Polian, Ilia, Becker, Bernd, Hellebrand, Sybille, Wunderlich, Hans-Joachim, Maxwell, Peter

Year:

2011

Language:

english

File:

PDF, 1.75 MB

english, 2011

28

Structural Test and Diagnosis for Graceful Degradation of NoC Switches

Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich

Journal:

Journal of Electronic Testing

Year:

2012

Language:

english

File:

PDF, 679 KB

english, 2012

29

[IEEE 2008 14th IEEE International On-Line Testing Symposium (IOLTS) - Rhodes, Greece (2008.07.7-2008.07.9)] 2008 14th IEEE International On-Line Testing Symposium - Integrating Scan Design and Soft Error Correction in Low-Power Applications

Imhof, Michael E., Wunderlich, Hans-Joachim, Zoellin, Christian G.

Year:

2008

Language:

english

File:

PDF, 530 KB

english, 2008

30

[IEEE 2011 International Symposium on Low Power Electronics and Design (ISLPED) - Fukuoka, Japan (2011.08.1-2011.08.3)] IEEE/ACM International Symposium on Low Power Electronics and Design - SAT-based capture-power reduction for at-speed broadcast-scan-based test compression architectures

Kochte, Michael A., Miyase, Kohei, Wen, Xiaoqing, Kajihara, Seiji, Yamato, Yuta, Enokimoto, Kazunan, Wunderlich, Hans-Joachim

Year:

2011

Language:

english

File:

PDF, 420 KB

english, 2011

31

Accurate X-Propagation for Test Applications by SAT-Based Reasoning

Kochte, Michael A., Elm, Melanie, Wunderlich, Hans-Joachim

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2012

Language:

english

File:

PDF, 1.65 MB

english, 2012

32

[IEEE 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) - Chicago, Illinois, USA (2009.10.7-2009.10.9)] 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems - Software-Based Hardware Fault Tolerance for Many-Core Architectures

Wunderlich, Hans-Joachim

Year:

2009

Language:

english

File:

PDF, 211 KB

english, 2009

33

[IEEE 2008 13th IEEE European Test Symposium (ETS) - Verbania, italy (2008.05.25-2008.05.29)] 2008 13th European Test Symposium - Selective Hardening in Early Design Steps

Zoellin, Christian G., Wunderlich, Hans-Joachim, Polian, Ilia, Becker, Bernd

Year:

2008

Language:

english

File:

PDF, 447 KB

english, 2008

34

[IEEE 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - Rome, Italy (2007.09.26-2007.09.28)] 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2007) - A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction

Hellebrand, Sybille, Zoellin, Christian G., Wunderlich, Hans-Joachim, Ludwig, Stefan, Coym, Torsten, Straube, Bernd

Year:

2007

Language:

english

File:

PDF, 1.14 MB

english, 2007

35

Test Strategies for Reliable Runtime Reconfigurable Architectures

Bauer, Lars, Braun, Claus, Imhof, Michael E., Kochte, Michael A., Schneider, Eric, Zhang, Hongyan, Henkel, Jorg, Wunderlich, Hans-Joachim

Journal:

IEEE Transactions on Computers

Year:

2013

Language:

english

File:

PDF, 2.36 MB

english, 2013

36

[IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - BISD: Scan-based Built-In self-diagnosis

Elm, Melanie, Wunderlich, Hans-Joachim

Year:

2010

Language:

english

File:

PDF, 227 KB

english, 2010

37

[ACM Press the 47th Design Automation Conference - Anaheim, California (2010.06.13-2010.06.18)] Proceedings of the 47th Design Automation Conference on - DAC '10 - Efficient fault simulation on many-core processors

Kochte, Michael A., Schaal, Marcel, Wunderlich, Hans-Joachim, Zoellin, Christian G.

Year:

2010

Language:

english

File:

PDF, 167 KB

english, 2010

38

[IEEE 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Chania (2013.7.8-2013.7.10)] 2013 IEEE 19th International On-Line Testing Symposium (IOLTS) - Efficacy and efficiency of algorithm-based fault-tolerance on GPUs

Wunderlich, Hans-Joachim, Braun, Claus, Halder, Sebastian

Year:

2013

Language:

english

File:

PDF, 122 KB

english, 2013

39

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - Programmable deterministic Built-In Self-Test

Hakmi, Abdul-Wahid, Wunderlich, Hans-Joachim, Zoellin, Christian G., Glowatz, Andreas, Hapke, Friedrich

Year:

2007

Language:

english

File:

PDF, 998 KB

english, 2007

40

[IEEE 2012 13th Latin American Test Workshop - LATW - Quito, Ecuador (2012.04.10-2012.04.13)] 2012 13th Latin American Test Workshop (LATW) - Built-in self-diagnosis targeting arbitrary defects with partial pseudo-exhaustive test

Cook, Alejandro, Hellebrand, Sybille, Imhof, Michael E., Mumtaz, Abdullah, Wunderlich, Hans-Joachim

Year:

2012

Language:

english

File:

PDF, 339 KB

english, 2012

41

[IEEE Conference Publications Design Automation and Test in Europe - Dresden, Germany (2014.03.24-2014.03.28)] Design, Automation & Test in Europe Conference & Exhibition (DATE), 2014 - Bit-Flipping Scan - A unified architecture for fault tolerance and offline test

Imhof, Michael E., Wunderlich, Hans-Joachim

Year:

2014

Language:

english

File:

PDF, 803 KB

english, 2014

42

[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - Module diversification: Fault tolerance and aging mitigation for runtime reconfigurable architectures

Zhang, Hongyan, Bauer, Lars, Kochte, Michael A., Schneider, Eric, Braun, Claus, Imhof, Michael E., Wunderlich, Hans-Joachim, Henkel, Jorg

Year:

2013

Language:

english

File:

PDF, 785 KB

english, 2013

43

[IEEE 12th IEEE European Test Symposium - Freiburg, Germany (2007.05.20-2007.05.24)] 12th IEEE European Test Symposium (ETS'07) - An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy

Ohler, Philipp, Hellebrand, Sybille, Wunderlich, Hans-Joachim

Year:

2007

Language:

english

File:

PDF, 709 KB

english, 2007

44

[IEEE 2012 17th IEEE European Test Symposium (ETS) - Annecy, France (2012.05.28-2012.05.31)] 2012 17TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Efficient system-level aging prediction

Hatami, Nadereh, Baranowski, Rafal, Prinetto, Paolo, Wunderlich, Hans-Joachim

Year:

2012

Language:

english

File:

PDF, 815 KB

english, 2012

45

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Restrict Encoding for Mixed-Mode BIST

Hakmi, Abdul-Wahid, Holst, Stefan, Wunderlich, Hans-Joachim, Schlöffel, Jürgen, Hapke, Friedrich, Glowatz, Andreas

Year:

2009

Language:

english

File:

PDF, 717 KB

english, 2009

46

[IEEE 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems - Krakow, Poland (2007.04.11-2007.04.13)] 2007 IEEE Design and Diagnostics of Electronic Circuits and Systems - Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair

Ohler, Philipp, Hellebrand, Sybille, Wunderlich, Hans-Joachim

Year:

2007

Language:

english

File:

PDF, 419 KB

english, 2007

47

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Variation-Aware Fault Modeling

Hopsch, Fabian, Becker, Bernd, Hellebrand, Sybille, Polian, Ilia, Straube, Bernd, Vermeiren, Wolfgang, Wunderlich, Hans-Joachim

Year:

2010

Language:

english

File:

PDF, 369 KB

english, 2010

48

[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - P-PET: Partial pseudo-exhaustive test for high defect coverage

Mumtaz, Abdullah, Imhof, Michael E., Wunderlich, Hans-Joachim

Year:

2011

Language:

english

File:

PDF, 793 KB

english, 2011

49

[IEEE 2013 18th IEEE European Test Symposium (ETS) - Avignon, France (2013.05.27-2013.05.30)] 2013 18TH IEEE EUROPEAN TEST SYMPOSIUM (ETS) - Scan pattern retargeting and merging with reduced access time

Baranowski, Rafal, Kochte, Michael A., Wunderlich, Hans-Joachim

Year:

2013

Language:

english

File:

PDF, 1.12 MB

english, 2013

50

[IEEE 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Platja d'Aro, Girona, Spain (2014.7.7-2014.7.9)] 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) - Area-efficient synthesis of fault-secure NoC switches

Dalirsani, Atefe, Kochte, Michael A., Wunderlich, Hans-Joachim

Year:

2014

Language:

english

File:

PDF, 186 KB

english, 2014

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